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• Kumamoto Technology Center
  ...oxide semiconductor]] (CMOS) components for [[camera phone]]s. [[Consumer electronics]] [[corporation]] [[Sony]] plans to invest 50 billion [[Yen|JPY]] in the Ce
  611 bytes (74 words) - 14:51, 10 December 2011
• Waveform monitor
  * In manufacturing test and [[research and development]] applications. * [http://www.swit.cc SWIT Electronics]
  5 KB (776 words) - 14:51, 10 December 2011
• Pogo pin
  A '''Pogo pin''' is a device used in [[electronics]] to establish a (usually temporary) connection between two [[printed circu ...of Everett Charles Technologies (ECT). ECT and its subsidiaries have been manufacturing Pogo pins for over forty years.
  3 KB (411 words) - 14:51, 10 December 2011
• Flying probe
  ...ircuits. They can be classified as [[in-circuit test]] (ICT) systems or as Manufacturing Defects Analyzers (MDAs). They provide an alternative to the [[Bed of nails [[Category:Electronics terms]]
  1 KB (174 words) - 14:51, 10 December 2011
• Automatic test equipment
  ATE is widely used in the electronic manufacturing industry to test electronic components and systems after being fabricated. ...re the part has a chance to be used in a final consumer product. To reduce manufacturing costs and improve [[yield]], semiconductor devices should to be tested afte
  20 KB (2,923 words) - 14:51, 10 December 2011
• Oscilloscope types
  ...uns, requiring tight control of axial (rotational) mechanical alignment in manufacturing the CRT. In the latter type, two independent pairs of vertical plates defle ...digital sampling oscilloscopes.<ref>"Oscilloscope Types" http://www.radio-electronics.com/info/t_and_m/oscilloscope/oscilloscope_types.php</ref><ref>"XYZs of Osc
  39 KB (6,076 words) - 14:52, 10 December 2011
• Oscilloscope
  ...uns, requiring tight control of axial (rotational) mechanical alignment in manufacturing the CRT. Beam-splitter types had horizontal deflection common to both verti ...If the expected signal is absent or incorrect, some preceding stage of the electronics is not operating correctly. Since most failures occur because of a single f
  56 KB (8,370 words) - 14:52, 10 December 2011
• IEEE-488
  ...>This part of HP was later spun off as [[Agilent Technologies]].</ref> was manufacturing various automated test and measurement instruments, such as digital [[multi In 1975, the [[Institute of Electrical and Electronics Engineers|IEEE]] standardized the bus as ''Standard Digital Interface for P
  18 KB (2,497 words) - 14:52, 10 December 2011

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